Spherical Aberration Electron Microscopy

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Spherical Aberration Electron Microscopy. A condenser aperture is used to reduce spherical aberration. Both defects are unavoidable in the case of static rotationally symmetric.


Spherical Aberration Electron Microscopy

Smith, in materials today, 2010. In this paper, we apply this concept to the correction of spherical aberration in a scanning transmission electron microscope and demonstrate an improveme.

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